Temperature dependent capacitance and conductance-voltage characteristics of Au/polyvinyl alcohol(Co,Zn)/n-Si Schottky diodes
dc.authorid | Fen Bilgisi Egitimi, Aksaray Egitim -- 0000-0001-8976-571X; | |
dc.contributor.author | Bülbül, Mehmet Mahir | |
dc.contributor.author | Bengi, Seda | |
dc.contributor.author | Dökme, İlbilge | |
dc.contributor.author | Altndal, Şemsettin | |
dc.contributor.author | Tunç, Tuncay | |
dc.date.accessioned | 13.07.201910:50:10 | |
dc.date.accessioned | 2019-07-29T19:26:31Z | |
dc.date.available | 13.07.201910:50:10 | |
dc.date.available | 2019-07-29T19:26:31Z | |
dc.date.issued | 2010 | |
dc.department | Eğitim Fakültesi | |
dc.description.abstract | The temperature dependence of capacitance-voltage (C-V) and conductance-voltage (G/w-V) characteristics of Au/polyvinyl alcohol (Co,Zn-doped)/n-Si Schottky diodes (SDs) was investigated by considering series resistance effect in the temperature range of 80-400 K. The C-V and G/w-V characteristics confirm that the series resistance (R(s)) and interface state density (N(ss)) of the diode are important parameters that strongly influence the electric parameters of SDs. The crossing of the G/w-V curves appears as an abnormality compared to the conventional behavior of ideal SDs. It is thought that the presence of series resistance keeps this intersection hidden and unobservable in homogeneous SDs but it appears in the case of inhomogeneous SDs. In addition, the high frequency C(m) and G(m)/w values measured under both reverse and forward bias were corrected for the effect of series resistance to obtain the real diode capacitance and conductance. | |
dc.description.sponsorship | Gazi University [FEF. 05/2008-22] | |
dc.description.sponsorship | This work was supported by Gazi University Research Project (BAB) under Grant No. FEF. 05/2008-22. | |
dc.identifier.doi | 10.1063/1.3462427 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.issue | 3 | en_US |
dc.identifier.scopusquality | Q1 | |
dc.identifier.uri | https://doi.org/10.1063/1.3462427 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12451/5627 | |
dc.identifier.volume | 108 | en_US |
dc.identifier.wos | WOS:000280941000134 | |
dc.identifier.wosquality | N/A | |
dc.indekslendigikaynak | Web of Science | |
dc.indekslendigikaynak | Scopus | |
dc.language.iso | en | |
dc.publisher | American Institute Physics | |
dc.relation.ispartof | JOURNAL OF APPLIED PHYSICS | |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject | Crystal Defects | |
dc.subject | Ion Implantation | |
dc.subject | Light Polarisation | |
dc.subject | Optical Materials | |
dc.subject | Optical Waveguides | |
dc.subject | Photoelasticity | |
dc.subject | Refractive Index | |
dc.title | Temperature dependent capacitance and conductance-voltage characteristics of Au/polyvinyl alcohol(Co,Zn)/n-Si Schottky diodes | |
dc.type | Article |